Failure-Oriented-Accelerated-Tests (FOATs) and their Roles in Making a Viable IC Package into a Reliable Product

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#probabilistic modeling #reliability #photonics #electronics #advanced packaging #heterogeneous integration

(25:38) - Dr. Ephraim Suhir, Portland State University

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

(25:38) - Dr. Ephraim Suhir, Portland State University

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

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