Test technologies for Ensuring Quality and Reliability

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(28:50 + Q&A) - Dr. Jeorge Hurtarte, Sr. Director, Engineering, Lam Research

Summary: As mobile and network backhaul data rates increase, new RF and photonics devices are emerging, extending from millimeter to nanometer in wavelength. These new devices present new test challenges, which, if not efficiently addressed with new test technologies, will put at risk their quality and reliability in the field. This keynote presentation provides an overview of such emerging high-data rate devices and applications, and the corresponding test challenges and test technologies required to mitigate such quality and reliability risks.
Dr. Jeorge S. Hurtarte is currently Sr. Director, Engineering, Office of the CTO, at Lam Research. Dr. Hurtarte has held various technical, management, and executive positions at Lam Research, Teradyne, LitePoint, TranSwitch, and Rockwell Semiconductors. He holds Ph.D. and B.S. degrees in electrical engineering, M.S. in Telecommunications, M.S. in Computer Science, and an MBA. Dr. Hurtarte has served in the Advisory Board of Directors of the Global Semiconductor Alliance, TUV Rheinland of North America, and NSF’s Wireless Internet Center for Advanced RF Technology. He is co-chair of the IEEE Heterogeneous Integration Roadmap test working group. Dr. Hurtarte is also professor at the University of California, Santa Cruz and at the University of Phoenix. He is a Registered Professional Engineer in the State of California, and the lead co-author of the book Understanding Fabless IC Technology.

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

(28:50 + Q&A) - Dr. Jeorge Hurtarte, Sr. Director, Engineering, Lam Research

Summary: As mobile and network backhaul data rates increase, new RF and photonics devices are emerging, extending from millimeter to nanometer in wavelength. These new devices present new test challenges, which, if not efficiently addressed with new test technologies, will put at risk their quality and reliability in the field. This keynote presentation provides an overview of such emerging high-data rate devices and applications, and the corresponding test challenges ...

 

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