Multiphysics Approach to Reliability Prediction of Integrated Circuits Due to Radiation Induced Failures

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#EDA #simulation #radiation #reliability #photonics #electronics #advanced packaging #heterogeneous integration

(21:10 + Q&A) - Ashok Alagappan, Ansys

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

(21:10 + Q&A) - Ashok Alagappan, Ansys

For videos/slides from other talks at the Symposium on Reliability of Electronics and Photonics Packaging (REPP'22), please visit our website and join our IEEE Dlist:  attend.ieee.org/repp

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